Nanoscale effects in devices based on chalcogenide solid solutions
- 31 May 2000
- journal article
- Published by Elsevier in Superlattices and Microstructures
- Vol. 27 (5-6), 485-488
- https://doi.org/10.1006/spmi.2000.0827
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
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- Structural characterization of ultrathin nanocrystalline silicon films formed by annealing amorphous siliconJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1998
- Polarity-dependent memory switching and behavior of Ag dendrite in Ag-photodoped amorphous As2S3 filmsJournal of Applied Physics, 1976