An improved specimen carrier for large‐scale embedment with lowicryl
- 1 January 1986
- journal article
- Published by Wiley in Journal of Electron Microscopy Technique
- Vol. 4 (1), 73-74
- https://doi.org/10.1002/jemt.1060040110
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Resin development for electron microscopy and an analysis of embedding at low temperature*Journal of Microscopy, 1982