SPICE Simulation of SOI MOSFET Integrated Circuits
- 1 October 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 5 (4), 653-658
- https://doi.org/10.1109/tcad.1986.1270235
Abstract
A five-terminal, charge-based model for the thin-film silicon-on-insulator (SOI) MOSFET is implemented in SPICE2, thereby enabling, for the first time, proper simulation and CAD of SOI MOS integrated circuits in which the unique floating-body and back-gate-bias effects can be significant. The implementation is achieved, without having to rewrite the circuit simulator, by developing a general method for incorporating new charge-based device models into SPICE2 that utilizes user-defined controlled sources (UDCS's). The utility and computing efficiency of the SOI MOSFET model implementation are demonstrated by simulating several representative SOI MOS circuits.Keywords
This publication has 11 references indexed in Scilit:
- VB-5 floating substrate effects on the switching characteristics of SOI MOSFETIEEE Transactions on Electron Devices, 1985
- A SPICE modeling technique for GaAs MESFET IC'sIEEE Transactions on Electron Devices, 1985
- Characteristics and Three-Dimensional Integration of MOSFET's in Small-Grain LPCVD Polycrystalline SiliconIEEE Journal of Solid-State Circuits, 1985
- VB-6 Charge-based large-signal modeling of thin-film SOI MOSFET'sIEEE Transactions on Electron Devices, 1984
- Threshold voltage of thin-film Silicon-on-insulator (SOI) MOSFET'sIEEE Transactions on Electron Devices, 1983
- An Investigation of the Charge Conservation Problem for MOSFET Circuit SimulationIEEE Journal of Solid-State Circuits, 1983
- A charge-oriented model for MOS transistor capacitancesIEEE Journal of Solid-State Circuits, 1978
- Characterization of silicon-on-sapphire IGFET transistorsIEEE Transactions on Electron Devices, 1977
- Properties of ESFI MOS transistors due to the floating substrate and the finite volumeIEEE Transactions on Electron Devices, 1975
- Conductance of MOS transistors in saturationIEEE Transactions on Electron Devices, 1969