Effect of the Condensed Phase on Dissociative Electron Attachment:CH3ClCondensed on a Kr Surface

Abstract

The absolute dissociative-electron-attachment cross section for ${\mathrm{CH}}_3\mathrm{Cl}$ condensed onto multilayer Kr films was measured and found to be as high as $(2.3\pm 0.9)\times {10}^{-17\mathrm{}}{\mathrm{cm}}^2$ (i.e., approximately ${10}^6$ times larger than that calculated for gaseous ${\mathrm{CH}}_3\mathrm{Cl}$). An $R$-matrix model of electron attachment to ${\mathrm{CH}}_3\mathrm{Cl}$ reproduces the enhancement and its variation with Kr film thickness.