Lifetimes of Levels ofS30and the Variation ofE2Transition Strengths withTzandA

Abstract

Doppler-shift attenuation measurements have yielded lifetimes of $\tau =254\mathrm{}\pm 23$ fs for the $2_1^{+}$, 2211-keV level and $\tau =169\mathrm{}\pm 21$ fs for the $2_2^{+}$, 3403-keV level in ${}_{}{}^{30}{}_{}{}^{}\mathrm{S}$. In conjunction with measurements in ${}_{}{}^{30}{}_{}{}^{}\mathrm{Si}$ and ${}_{}{}^{30}{}_{}{}^{}\mathrm{P}$, these results establish the linear relation between ${\left({\mathrm{}\left|M\right|\mathrm{}}^2\right)}^{\frac{1}{2}}$ and $T_z$ for $\Delta T=0\mathrm{}$, $E2\mathrm{}$ analog transitions. These results and other data for neighboring $s-d$-shell nuclei show that the isoscalar strenghts of $2_1^{+}$→$0_1^{+}$ transitions are less enhanced for $T=1\mathrm{}$ than for $T=0\mathrm{}$ nuclei.