Fluorescent X-Ray Relative-Intensity Measurements
- 1 April 1972
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 5 (4), 1587-1591
- https://doi.org/10.1103/physreva.5.1587
Abstract
Measured values of the relative intensities of several fluorescent x rays are reported for 13 elements ranging from cerium through plutonium. A solid-state Si(Li) spectrometer and a Bragg-diffraction spectrometer were used to analyze the x-ray excited fluorescence from thin samples. Corrections were made to the measured relative intensities for sample absorption, air absorption, and spectrometer efficiency. The accuracy of the measurements varies from ±5 to ±15%. The results are compared with those from the Scofield calculations.
Keywords
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