Quasiparticle calculations of the electronic properties ofandpolymorphs and their interface with Si
- 21 January 2010
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 81 (3)
- https://doi.org/10.1103/physrevb.81.035330
Abstract
Quasiparticle calculations are performed to investigate the electronic band structures of various polymorphs of Hf and Zr oxides. The corrections with respect to density-functional-theory results are found to depend only weakly on the crystal structure. Based on these bulk calculations as well as those for bulk Si, the effect of quasiparticle corrections is also investigated for the band offsets at the interface between these oxides and Si assuming that the lineup of the potential at the interface is reproduced correctly within density-functional theory. On the one hand, the valence-band offsets are practically unchanged with a correction of a few tenths of electron volts. On the other hand, conduction-band offsets are raised by 1.3\char21{}1.5 eV. When applied to existing calculations for the offsets at the density-functional-theory level, our quasiparticle corrections provide results in good agreement with the experiment.Keywords
All Related Versions
This publication has 64 references indexed in Scilit:
- Density functional theory of high-k dielectric gate stacksMicroelectronics Reliability, 2007
- Bonding and interface states ofandinterfacesPhysical Review B, 2006
- Theoretical studies of solid–solid interfacesCurrent Opinion in Solid State and Materials Science, 2006
- Erratum: First-principles investigation of high-κdielectrics: Comparison between the silicates and oxides of hafnium and zirconium [Phys. Rev. B69, 184301 (2004)]Physical Review B, 2004
- First-principles investigation of high-dielectrics: Comparison between the silicates and oxides of hafnium and zirconiumPhysical Review B, 2004
- First-principles exploration of alternative gate dielectrics: Electronic structure of and interfacesPhysical Review B, 2004
- Bonding, Energies, and Band Offsets of and Gate Oxide InterfacesPhysical Review Letters, 2004
- First-principles study of dynamical and dielectric properties of tetragonal zirconiaPhysical Review B, 2001
- High-κ gate dielectrics: Current status and materials properties considerationsJournal of Applied Physics, 2001
- Band engineering at interfaces: theory and numerical experimentsJournal of Physics D: Applied Physics, 1998