Breakdown of Thin-Film Emitters
- 1 January 1972
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 43 (1), 242-243
- https://doi.org/10.1063/1.1660820
Abstract
The examination of thin‐film emitters in the scanning electron microscope has revealed a mechanism by which they break down. The top film is continuous when emission is first obtained from the device but microscopic punctures appear after a short period of operation and the emission becomes unstable. Eventually the device ceases to conduct as the number and size of the micropunctures increase.Keywords
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