Optical reflectivity measurements using a laser plasma light source
- 6 November 1989
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 55 (19), 1955-1957
- https://doi.org/10.1063/1.102335
Abstract
Light produced by a laser plasma light source (LPLS) is used to perform optical reflectivity measurements on single crystals from 5 to 40 eV in a single experiment. The intense continuum generated by the rare‐earth plasma allows a significantly higher resolution above 15 eV and extends the measurements to higher energies than those attainable with other laboratory based light sources. This is the first application of a LPLS to vacuum ultraviolet spectroscopy of solids and we demonstrate this capability on two insulating materials, α‐Al2O3 and MgAl2O4.Keywords
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