Small area x‐ray photoelectron spectroscopy
- 1 October 1983
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 5 (5), 217-221
- https://doi.org/10.1002/sia.740050508
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Imaging XPS—A new technique, I—principlesSurface and Interface Analysis, 1983
- Selected area X-ray photoelectron spectroscopySurface and Interface Analysis, 1981
- The quantitative analysis of surfaces by XPS: A reviewSurface and Interface Analysis, 1980