Testing by Feedback Shift Register
- 1 July 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-29 (7), 668-673
- https://doi.org/10.1109/tc.1980.1675641
Abstract
A compact testing method called feedback shift register testing (FSR testing) is presented and its properties, concerning detection and diagnosis, are given. The new notion of distinction potential is introduced. The proposed method is shown to have the maximum resolution and the maximum distinction potential that can be found for an m-bit signature.Keywords
This publication has 6 references indexed in Scilit:
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