Analysis of the Broadening of Powder Pattern Peaks Using Variance, Integral Breadth, and Fourier Coefficients of the Line Profile
- 1 January 1966
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- The integral width of the convolution of a Gaussian and a Cauchy distributionActa Crystallographica, 1965
- A study on the X-ray line profilePhysica, 1964
- Particle Size and Strain in Deformed TungstenProceedings of the Physical Society, 1963
- On Variance as a Measure of Line Broadening in Diffractometry General Theory and Small Particle SizeProceedings of the Physical Society, 1962
- Variance as a Measure of Line BroadeningNature, 1962
- CERTAIN X-RAY DIFFRACTION METHODS OF INVESTIGATING COLD WORKED METALSSoviet Physics Uspekhi, 1961
- X-ray studies of deformed metalsProgress in Metal Physics, 1959
- The Effect of Cold-Work Distortion on X-Ray PatternsJournal of Applied Physics, 1950
- A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder PhotographsProceedings of the Physical Society, 1948
- The measurement of particle size by the X-ray methodProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1938