Studies of diffused boron emitters: saturation current, bandgap narrowing, and surface recombination velocity
- 1 June 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 38 (6), 1399-1409
- https://doi.org/10.1109/16.81632
Abstract
No abstract availableKeywords
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