Tilt moiré patterns
- 1 February 1974
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 45 (2), 588-592
- https://doi.org/10.1063/1.1663288
Abstract
Consideration is given to the image formed in the electron microscope of two crystals stacked one above the other when these show a relative rotation about an axis perpendicular to the electron beam. Dark‐field moiré fringe patterns are predicted when certain conditions relating to the relative proximity to the Bragg condition of the two crystals are fulfilled. The limits of these conditions and the spacings of the fringes are formulated in terms of the angle of tilt and the direction of the tilt axis.Keywords
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