X-RAY emission measurements of oxygen on the (0001) and (101
- 30 April 1976
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 55 (1), 367-372
- https://doi.org/10.1016/0039-6028(76)90397-6
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Preparation and characterization of tellurium surfacesJournal of Crystal Growth, 1975
- Quantitative determination of oxygen in thin oxide films on metals by electron-excited X-ray emissionThin Solid Films, 1974
- Early stages of oxidation of Fe(001) observed by electron diffraction and x-ray emissionSurface Science, 1972
- Electron Spectroscopy - A Potentially Useful Tool for Environmental StudiesInternational Journal of Environmental Analytical Chemistry, 1972
- Quantitative X-Ray Emission Analysis of Thin Oxide Films on TantalumJournal of Applied Physics, 1971
- Crystalline Morphology and Electrical Properties of Selenium Epitaxilly Grown on TelluriumJapanese Journal of Applied Physics, 1970
- The study of epitaxy in thin surface filmsAdvances in Physics, 1956