Relative intensity factors for K, L and M shell x-ray lines
- 1 April 1982
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 11 (2), 42-45
- https://doi.org/10.1002/xrs.1300110203
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- A quantitative X-ray microanalysis thin film method using K-, L-, and M-linesUltramicroscopy, 1981
- Relative transition probabilities for the x-ray lines from the K levelJournal of Applied Physics, 1979
- Hartree-Fock values ofx-ray emission ratesPhysical Review A, 1974
- Exchange corrections ofx-ray emission ratesPhysical Review A, 1974
- Radiative-Transition-Probability Ratios for Elements of Low Atomic Numbers in Amorphous and Crystal FormsPhysical Review A, 1972
- X-Ray Fluorescence Yields, Auger, and Coster-Kronig Transition ProbabilitiesReviews of Modern Physics, 1972
- Auger and Coster-Kronig Transition Probabilities to the AtomicState and TheoreticalFluorescence YieldsPhysical Review A, 1971
- Theoretical - and -Subshell Fluorescence Yields and Coster-Kronig Transition ProbabilitiesPhysical Review A, 1971
- Atomic L-Shell Coster-Kronig, Auger, and Radiative Rates and Flourescence Yields for Na-ThPhysical Review A, 1971
- New type of auger effect and its influence on the x-ray spectrumPhysica, 1935