Interpretation of High-temperature creep of SiC by deformation mapping techniques
- 31 January 1977
- journal article
- Published by Elsevier in Materials Science and Engineering
- Vol. 27 (1), 83-88
- https://doi.org/10.1016/0025-5416(77)90198-7
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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