Doping of a dielectric layer as a new alternative for increasing sensitivity of the contactless conductivity detection in microchips

Abstract

This communication describes a new procedure to increase the sensitivity of C⁴D in PDMS/glass microchips. The method consists in doping the insulating layer (PDMS) over the electrodes with nanoparticles of TiO₂, increasing thus its dielectric constant. The experimental protocol is simple, inexpensive, and fast.