Evaluation of electron inelastic mean free paths for selected elements and compounds
- 16 February 2000
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 29 (2), 108-114
- https://doi.org/10.1002/(sici)1096-9918(200002)29:2<108::aid-sia700>3.0.co;2-4
Abstract
No abstract availableKeywords
This publication has 34 references indexed in Scilit:
- Relationships between electron inelastic mean free paths, effective attenuation lengths, and mean escape depthsJournal of Electron Spectroscopy and Related Phenomena, 1999
- Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid SurfacesJournal of Physical and Chemical Reference Data, 1999
- Surface sensitivity of Auger-electron spectroscopy and X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1999
- Elastic backscattering of electrons from polycrystalline tungsten and determination of electron inelastic mean free pathPhysica Status Solidi (a), 1995
- Experimental determination of the inelastic mean free path (IMFP) of electrons in Cr, Mo, Ge and Si based on the elastic peak intensity ratio with a Ni reference sampleSurface Science, 1995
- Inelastic mean free path of medium energy electrons in Au, Pt, Ni and Al determined by Elastic peak electron spectroscopySurface and Interface Analysis, 1994
- Comparison of the attenuation lengths and the inelastic mean-free path for photoelectrons in silverJournal of Vacuum Science & Technology A, 1990
- Multiple scattering analysis for determining the electron inelastic mean free path (IMFP) by elastic peak electron spectroscopyVacuum, 1990
- Experimental determination of the inelastic mean free path of electrons in solidsSurface Science, 1989
- The inelastic mean free path of electrons in some semiconductor compounds and metalsSurface and Interface Analysis, 1984