Automatic System Level Test a Fault Location for Large Digital Systems
- 1 January 1978
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A system for automatic test generation and fault location, FLT-700, is described in this paper. It can treat large digital systems with 100K blocks (logic gates) or more. This is realized by utilizing Scan-Path concept, automatic partitioning and test generation techniques and automatic fault location technique. Serviceability for large computer systems can, therefore, be improved and easy maintenance realized.Keywords
This publication has 3 references indexed in Scilit:
- A Heuristic Algorithm for the Testing of Asynchronous CircuitsIEEE Transactions on Computers, 1971
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- Design of Serviceability Features for the IBM System/360IBM Journal of Research and Development, 1964