The Limiting Energy Resolution of SiC Detectors in Ion Spectrometry
- 1 January 2005
- journal article
- Published by Pleiades Publishing Ltd in Semiconductors
- Vol. 39 (12), 1420-1425
- https://doi.org/10.1134/1.2140317
Abstract
The Monte Carlo method is used to simulate the complete stopping of α particles in SiC. A histogram of energy losses in nuclear-scattering events is obtained. The energy-loss spectrum has the characteristic asymmetric shape with the line full width at the half-maximum FWHMnucl ≈ 4.22 keV. The final shape of the spectral line is obtained by a convolution with the Gaussian function that describes the contribution of the ionization and noise fluctuations (originated in the detector and instrumentation) to the signal. The resulting value of FWHM for the line is equal to 8.75 keV (at a noise variance of 1.7 keV). The experimental energy resolution of the detectors was found to be poorer than the calculated value by a factor of 2. It is established that the losses of charge during its transport in the detector bulk are insignificant, so that the discrepancy between the calculated and experimental values of the resolution should be attributed to the nonoptimal design of the detector window.Keywords
This publication has 10 references indexed in Scilit:
- Physics of Semiconductor DevicesPublished by Wiley ,2006
- High Energy Resolution Detectors Based on 4H-SiCMaterials Science Forum, 2005
- Silicon Carbide for Alpha, Beta, Ion and Soft X-Ray High Performance DetectorsMaterials Science Forum, 2005
- Growth of Device Quality 4H-SiC High Velocity EpitaxyMaterials Science Forum, 2004
- Detection of strongly and weakly ionizing radiation by triode structure based on SiC filmsJournal of Applied Physics, 2003
- Amplification of the signal in triode structures of ion detectors based on 6H-SIC epitaxial filmsApplied Physics Letters, 2001
- Epitaxial silicon carbide charge particle detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1999
- Pulse Height Defect and Energy Dispersion in Semiconductor DetectorsReview of Scientific Instruments, 1966
- Nuclear collisions and ionisation fluctuations in charged particle detectorsPhysics Letters, 1962
- Ionization Yield of Radiations. II. The Fluctuations of the Number of IonsPhysical Review B, 1947