Study on the Resolution of the Backscattered Electron Image by the Monte Carlo Method
- 1 September 1971
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 10 (9), 1290-1291
- https://doi.org/10.1143/jjap.10.1290
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Monte Carlo Calculations on Electron Scattering in a Solid TargetJapanese Journal of Applied Physics, 1971
- Monte Carlo Calculations of the Electron-Sample Interactions in the Scanning Electron MicroscopeJournal of Applied Physics, 1971
- NEW CONTRAST MECHANISM FOR SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1970
- The determination of the area of emission of reflected electrons in a scanning electron microscopeJournal of Scientific Instruments, 1965