Auger spectroscopy of silicon
- 31 October 1969
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 17 (2), 462-465
- https://doi.org/10.1016/0039-6028(69)90117-4
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Thin reaction layers and the surface structure of silicon (111)Surface Science, 1969
- Auger Electron Spectroscopy of fcc Metal SurfacesJournal of Applied Physics, 1968
- Analysis of Materials by Electron-Excited Auger ElectronsJournal of Applied Physics, 1968
- Use of LEED Apparatus for the Detection and Identification of Surface ContaminantsJournal of Applied Physics, 1967