The effect of magnetic domain structure on Bragg reflection in transmission electron microscopy
- 1 August 1964
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 10 (104), 277-290
- https://doi.org/10.1080/14786436408225665
Abstract
Usual methods of observing magnetic domain walls in transmission electron microscopy all rely on the deflection caused to the electron beam by the Lorentz force. This deflection can also alter the conditions for Bragg reflection of the electrons. In buckled specimens containing bend extinction contours, the position of the contours can be altered. This effect is particularly noticeable in cobalt, where two different types of effects have been observed. In addition to revealing the position of the domain walls when the specimen is in focus, the effect provides an interesting visible demonstration of the magnetostatic potential distribution in uniaxial thin films proposed by Málek and Kamberský (1958).Keywords
This publication has 7 references indexed in Scilit:
- A modified goniometer specimen holder for the Siemens electron microscope operating under long focal length conditionsJournal of Scientific Instruments, 1964
- Magnetic domain walls in thin films of nickel and cobaltPhilosophical Magazine, 1963
- Antiparallele Weißsche Bereiche als Biprisma für ElektroneninterferenzenThe European Physical Journal A, 1960
- Determination of Magnetization Distribution in Thin Films Using Electron MicroscopyJournal of Applied Physics, 1960
- An electro-polishing technique for the preparation of metal specimens for transmission electron microscopyPhilosophical Magazine, 1958
- On the theory of the domain structure of thin films of magnetically uni-axial materialsCzechoslovak Journal of Physics, 1958
- Electron Microscope and Diffraction Study of Metal Crystal Textures by Means of Thin SectionsJournal of Applied Physics, 1949