Yield optimization of analog ICs using two-step analytic modeling methods
- 1 July 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 28 (7), 778-783
- https://doi.org/10.1109/4.222176
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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