Observation of strain in the Si(111) 7×7 surface
- 15 March 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 37 (8), 4325-4328
- https://doi.org/10.1103/physrevb.37.4325
Abstract
X-ray diffraction intensities for 120 independent superlattice reflections of the clean reconstructed Si(111) 7×7 surface have been measured using improved sources and techniques. Starting from the Takayanagi model, we have refined a full set of in-plane structural coordinates and determined the atom positions to within 0.02 Å. Our structure clearly shows the local strain fields expected around the adatoms as well as a general dilation of the reconstructed layers showing the presence of strain.Keywords
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