Application of high voltage electron microscopy to low‐temperature radiation damage studies in metals
- 3 January 1973
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 97 (1-2), 121-127
- https://doi.org/10.1111/j.1365-2818.1973.tb03766.x
Abstract
No abstract availableKeywords
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