Jet Thinning Device for Preparation of Al2O3 Electron Microscope Specimens
- 1 April 1964
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 35 (4), 520-521
- https://doi.org/10.1063/1.1718866
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Stacking Fault Energy in SiliconJournal of Applied Physics, 1962
- Sample Preparation for Transmission Electron Microscopy of GermaniumReview of Scientific Instruments, 1961
- Preparation of Thin Metal Foils from Ordinary Tensile Specimens for Use in Transmission Electron MicroscopyReview of Scientific Instruments, 1961
- Electron Microscope and Diffraction Study of Metal Crystal Textures by Means of Thin SectionsJournal of Applied Physics, 1949