Microstructure and light emission of ac thin-film electroluminescent devices
- 1 June 1982
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 53 (6), 4146-4151
- https://doi.org/10.1063/1.331237
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Application of thin film electroluminescent devicesJournal of Luminescence, 1981
- Device characterization of an electron-beam-switched thin-film ZnS:Mn electroluminescent faceplateIEEE Transactions on Electron Devices, 1981
- Probe layer measurements of electroluminescence excitation in ac thin-film devicesJournal of Applied Physics, 1981
- Cross‐Sectional Transmission Electron Microscopy For Polycrystalline Silicon FilmsJournal of Microscopy, 1980
- Physical and electrical characterization of co-deposited Zns:Mn electroluminescent thin film structuresJournal of Electronic Materials, 1979
- Limitation imposed by field clamping on the efficiency of high-field ac electroluminescence in thin filmsJournal of Applied Physics, 1972
- Fabrication of rf-Sputtered Barium Titanate Thin FilmsJournal of Vacuum Science and Technology, 1971