Intelligent interface for a microprocessor controlled scanning transmission electron microscope with x‐ray imaging
- 1 January 1984
- journal article
- research article
- Published by Wiley in Journal of Electron Microscopy Technique
- Vol. 1 (2), 175-184
- https://doi.org/10.1002/jemt.1060010206
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- High-Resolution Scanning Transmission Electron MicroscopyScience, 1983
- Electron probe and electron energy loss analysis in biologyUltramicroscopy, 1982
- Microcomputer control of a stemUltramicroscopy, 1982
- Cryoultramicrotomy: evidence against melting and the use of a low temperature cement for specimen orientationJournal of Microscopy, 1982
- Fast digital data acquisition and on-line processing system for an HB5 scanning transmission electron microscopeReview of Scientific Instruments, 1981
- Elemental mapping using digital storage and colour displayScanning, 1980
- High-resolution scanning transmission electron microscope at Johns HopkinsReview of Scientific Instruments, 1979
- Quantitative electron probe microanalysis of biological thin sections: Methods and validityUltramicroscopy, 1976