Medium energy ion scattering study of Ni on ultrathin films of SiO2 on Si(111)
- 1 March 1993
- journal article
- Published by Elsevier in Surface Science
- Vol. 284 (1-2), 67-76
- https://doi.org/10.1016/0039-6028(93)90525-o
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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