Surface reconstructions of Si(001) observed using reflection-high- energy-electron diffraction during molecular-beam epitaxial growth from disilane
- 23 December 1991
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 59 (26), 3419-3421
- https://doi.org/10.1063/1.105694
Abstract
No abstract availableKeywords
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