Some Observations on the Use of Elliptically Polarized Light to Study Metal Surfaces*
- 1 July 1963
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 53 (7), 788-793
- https://doi.org/10.1364/josa.53.000788
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 8 references indexed in Scilit:
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- The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface FilmsReview of Scientific Instruments, 1945
- Built-Up Films of Barium Stearate and Their Optical PropertiesPhysical Review B, 1937
- Films Built by Depositing Successive Monomolecular Layers on a Solid SurfaceJournal of the American Chemical Society, 1935