Enhancement of surface-atom intensities in X-ray photoelectron spectra at low X-ray incidence angles
- 3 November 1975
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 55 (1), 59-61
- https://doi.org/10.1016/0375-9601(75)90394-1
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Instrumentation for surface studies: XPS angular distributionsJournal of Electron Spectroscopy and Related Phenomena, 1974
- Attenuation lengths of low-energy electrons in solidsSurface Science, 1974
- Surface analysis and angular distributions in x-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1974
- Surface sensitivity and angular dependence of X-ray photoelectron spectraSurface Science, 1973
- Ultrasoft-X-Ray Reflection, Refraction, and Production of Photoelectrons (100-1000-eV Region)Physical Review A, 1972
- Escape Depths of X-ray Excited ElectronsPhysica Scripta, 1972