Four Point Mercury Contact Probe for Electrical Resistivity Measurements of Thin Films
- 1 August 1968
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 39 (8), 1207-1208
- https://doi.org/10.1063/1.1683619
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Contactless Measurement of Resistivity of Slices of Semiconductor MaterialsReview of Scientific Instruments, 1967