High resolution depth profiling of light elements in high atomic mass materials
- 15 December 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 218 (1-3), 125-128
- https://doi.org/10.1016/0167-5087(83)90967-5
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- A high resolution spectrometer used in MeV heavy ion backscattering analysisNuclear Instruments and Methods in Physics Research, 1981
- High precision depth profiling of light isotopes in low-atomic-mass solidsJournal of Applied Physics, 1980
- The use of 6Li and 35Cl ion beams in surface analysisNuclear Instruments and Methods, 1978
- Preliminary results with a penning ion source on a 5.5 MV Van de Graaff acceleratorNuclear Instruments and Methods, 1975