Four-probe resistance measurements of nickel wires written with a scanning tunneling microscope/scanning electron microscope system
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 1438-1442
- https://doi.org/10.1016/0304-3991(92)90462-s
Abstract
No abstract availableKeywords
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