Full two-port on-wafer vector network analysis to 120 GHz using active probes
- 31 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1339-1342 vol.3
- https://doi.org/10.1109/mwsym.1993.277124
Abstract
A millimeter-wave full two-port on-wafer vector network analyzer (VNA) is implemented with monolithic GaAs directional time-domain reflectometer integrated circuits mounted directly on low-loss microwave wafer probes. The VNA performs S-parameter measurements to 120 GHz with +or- 0.2 dB repeatability using a line-reflect-match calibration method.<>Keywords
This publication has 7 references indexed in Scilit:
- 8-96 GHz on-wafer network analysisPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- 100 GHz high-gain InP MMIC cascode amplifierPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Monolithic integrated circuits for mm-wave instrumentationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A 2.3-ps time-domain reflectometer for millimeter-wave network analysisIEEE Microwave and Guided Wave Letters, 1991
- GaAs nonlinear transmission lines for picosecond pulse generation and millimeter-wave samplingIEEE Transactions on Microwave Theory and Techniques, 1991
- 275 GHz 3-mask integrated GaAs sampling circuitElectronics Letters, 1990
- Thru-Match-Reflect: One Result of a Rigorous Theory for De-Embedding and Network Analyzer CalibrationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1988