Reflection-mode near-field optical microscope with a metallic probe tip for observing fine structures in semiconductor materials
- 15 January 1997
- journal article
- Published by Elsevier in Optics Communications
- Vol. 134 (1-6), 31-35
- https://doi.org/10.1016/s0030-4018(96)00555-x
Abstract
No abstract availableKeywords
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