Optical Properties of Evaporated Films of Chromium and Copper

Abstract
The optical constants of Cr and Cu films were obtained as functions of optical thickness by the method of Malé for 5460 Å. The thickness range of the samples was from 80 Å to 800 Å, by weight. The theoretical model of ellipsoidal particles of David was employed to interpret the results; agreement was obtained if an effective refractive index within the particles different from the bulk material was adopted.This result indicated that the anomalous optical constants of the films were due to both the aggregated structure and a diminution of the mean free path of the free electrons in the aggregates.