Determination of anomalous scattering factors in GaAs using x-ray refraction through a prism
- 15 March 1985
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 31 (6), 3599-3605
- https://doi.org/10.1103/physrevb.31.3599
Abstract
The advantages of synchrotron radiation have been employed to revitalize a 60-year-old technique for measuring anomalous scattering factors by accurately measuring x-ray refraction through a prism. We report results obtained from a GaAs sample in the vicinity of both the Ga and As K absorption edges. Our analysis of the technique shows that relative accuracies of 0.03 electrons and absolute accuracies of 0.1 electrons should be readily obtainable. This should be adequate for the needs of anomalous x-ray scattering measurements.Keywords
This publication has 15 references indexed in Scilit:
- Determination of the anomalous scattering factors for Cu, Ni and Ti using the dispersion relationJournal of Applied Crystallography, 1984
- Noninterferometric measurement of the x-ray refractive index of berylliumPhysical Review B, 1984
- X-ray refractive-index measurement in silicon and lithium fluoridePhysical Review B, 1984
- Reliability of partial structure factors determined by anomalous dispersion of x-raysPhysical Review B, 1982
- Application of Differential Anomalous X-Ray Scattering to Structural Studies of Amorphous MaterialsPhysical Review Letters, 1981
- Measurements of anomalous dispersion made with X-ray interferometersProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1981
- Rayleigh scattering by neutral atoms, 100 eV to 10 MeVPhysical Review A, 1980
- Anomalous scattering of X-rays by cesium and cobalt measured with synchrotron radiationActa Crystallographica Section A, 1980
- Anomalous scattering determinations of the pair distribution functions in amorphous GeSeJournal of Non-Crystalline Solids, 1980
- Relativistic Calculation of Anomalous Scattering Factors for X RaysThe Journal of Chemical Physics, 1970