A new method to measure stress-induced birefringence in an opaque material: Stress-induced Raman scattering

Abstract

We describe a new technique to measure the piezo-optical constants of a material in a frequency region where it is opaque. The technique employs Raman scattering. Using this new method we measure the magnitudes of the piezo-optical constants π₁₁ − π₁₂ and π₄₄ in silicon at 1.92 eV. Previous measurements were limited to below and near the fundamental edge at 1.1 eV. Using this technique it should be possible to extend the measurements of the piezo-optical constants in a large number of opaque materials.