Investigation of surface reactions by the static method of secondary ion mass spectrometry: III. The oxidation of vanadium, niobium and tantalum in the monolayer range
- 30 September 1973
- journal article
- Published by Elsevier in Surface Science
- Vol. 39 (2), 427-436
- https://doi.org/10.1016/0039-6028(73)90013-7
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)Surface Science, 1973
- Auger Electron Spectroscopy Investigations of the Surface Chemical Composition of Vanadium, the Vanadium Oxides, and Oxidized Vanadium: Chemical Shift and Peak Intensity AnalysisThe Journal of Chemical Physics, 1972
- Variation of Concentration with Depth of Absorbed Oxygen in Niobium during OxidationJournal of Applied Physics, 1972
- A kinetic study of the initial oxidation of a Ta(110) surface using oxygen kα X-ray emissionSurface Science, 1972
- A rheed study of the adsorption of oxygen, hydrogen, nitrogen and water vapour on the (100) face of tantalumSurface Science, 1971
- Beobachtung von oberflächenreaktionen mit der statischen methode der sekundärionen-massenspektroskopie. I die methodeSurface Science, 1971
- Interpretation of Ellipsometric Observations of Absorbed Oxygen in Niobium*Journal of the Optical Society of America, 1970
- Chemical shifts in Auger electron spectroscopy from the initial oxidation of Ta(110)Physics Letters A, 1969
- Adsorption on Niobium (110), Tantalum (110), and Vanadium (110) SurfacesThe Journal of Chemical Physics, 1967
- Initial Oxidation of Tantalum Observed in a Field Ion MicroscopeJournal of Applied Physics, 1965