Development of a C60+ ion gun for static SIMS and chemical imaging
- 12 September 2002
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 203-204, 219-222
- https://doi.org/10.1016/s0169-4332(02)00629-3
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Performance characteristics of a chemical imaging time-of-flight mass spectrometerRapid Communications in Mass Spectrometry, 1998
- Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardmentApplied Surface Science, 1998
- A Comparison of Desorption Yields from C+60 to Atomic and Polyatomic Projectiles at keV EnergiesRapid Communications in Mass Spectrometry, 1996