Theory of the laser diode interaction in scanning force microscopy
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 25 (8), 1968-1972
- https://doi.org/10.1109/3.34059
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Compact scanning-force microscope using a laser diodeOptics Letters, 1988
- Force microscope using a fiber-optic displacement sensorReview of Scientific Instruments, 1988
- Force microscopy of magnetization patterns in longitudinal recording mediaApplied Physics Letters, 1988
- High-resolution capacitance measurement and potentiometry by force microscopyApplied Physics Letters, 1988
- Atomic force microscopy using optical interferometryJournal of Vacuum Science & Technology A, 1988
- Application of atomic force microscopy to magnetic materialsJournal of Vacuum Science & Technology A, 1988
- High-resolution magnetic imaging of domains in TbFe by force microscopyApplied Physics Letters, 1988
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- The influence of feedback intensity on longitudinal mode properties and optical noise in index-guided semiconductor lasersIEEE Journal of Quantum Electronics, 1984