Optimization of antireflection coating thickness for textured polycrystalline silicon solar cells — an experimental study
- 30 April 1990
- journal article
- Published by Elsevier in Solar Cells
- Vol. 28 (3), 253-260
- https://doi.org/10.1016/0379-6787(90)90059-e
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Reflection characteristics of textured polycrystalline silicon substrates for solar cellsSolar Cells, 1988
- Principle of a new reflectometer for measuring dielectric film thickness on substrates of arbitrary surface characteristicsReview of Scientific Instruments, 1988
- Design of antireflection coatings for textured silicon solar cellsSolar Cells, 1983
- Intensity enhancement in textured optical sheets for solar cellsIEEE Transactions on Electron Devices, 1982