External-reflection near-field optical microscope with cross-polarized detection
- 10 February 1994
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 33 (5), 876-880
- https://doi.org/10.1364/ao.33.000876
Abstract
An external-reflection scanning near-field optical microscope with the detected light polarized perpendicular to the polarization of the light coupled into the fiber is presented. When various metallic gratings are scanned, it is shown that the lateral and the depth resolutions of this microscope are better than 100 and 10 nm, respectively.This publication has 15 references indexed in Scilit:
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