A statistical theory of digital circuit testability
- 1 April 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 39 (4), 582-586
- https://doi.org/10.1109/12.54854
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- A theory of testability with application to fault coverage analysisPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Advanced automatic test pattern generation and redundancy identification techniquesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Test generation by fault samplingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Test Length in a Self-Testing EnvironmentIEEE Design & Test of Computers, 1985
- Statistical Fault AnalysisIEEE Design & Test of Computers, 1985