A theory of testability with application to fault coverage analysis
- 7 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 139-143
- https://doi.org/10.1109/etc.1989.36235
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Advanced automatic test pattern generation and redundancy identification techniquesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Test generation by fault samplingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A statistical theory of digital circuit testabilityIEEE Transactions on Computers, 1990
- Test Length in a Self-Testing EnvironmentIEEE Design & Test of Computers, 1985
- Statistical Fault AnalysisIEEE Design & Test of Computers, 1985