Electronic structure of the deep boron acceptor in boron-doped-SiC
- 15 January 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 57 (3), 1607-1619
- https://doi.org/10.1103/physrevb.57.1607
Abstract
A high-frequency (95 GHz) and conventional-frequency (9.3 GHz) pulsed electron paramagnetic resonance and electron-nuclear double resonance (ENDOR) study is reported on the deep boron acceptor in -SiC. The results support a model in which the deep boron acceptor consists of a boron on a silicon position with an adjacent carbon vacancy. The carbon vacancy combines with a boron along the hexagonal axis. It is concluded that 70–90% of the spin density resides in the silicon dangling bonds surrounding the vacancy and another 9% on the neighboring carbon atoms. The spin-density distribution is more localized than in the case of the shallow boron acceptor as deduced from the ENDOR experiments.
Keywords
This publication has 23 references indexed in Scilit:
- Acceptor Impurities in Silicion Carbide: Electron Paramagnetic Resonance and Optically Detected Magnetic Resonance StudiesDefect and Diffusion Forum, 1997
- Electron paramagnetic resonance of the group-III deep acceptor impurities in SiCSolid State Communications, 1996
- Electron paramagnetic resonance of deep boron in silicon carbideSemiconductor Science and Technology, 1996
- Deep level defects in alpha particle irradiated 6H silicon carbideJournal of Applied Physics, 1995
- Electron spin resonance studies of transition metal deep level impurities in SiCMaterials Science and Engineering B, 1992
- Boron-related deep centers in 6H-SiCApplied Physics A, 1990
- Site effect on the impurity levels in,, andSiCPhysical Review B, 1980
- Site-dependent donor and acceptor levels in 6 H-SiCJournal of Luminescence, 1979
- Free-to-bound transition in β-SiC doped with boronPhysica Status Solidi (a), 1975
- Electron Spin Resonance Studies in SiCPhysical Review B, 1961